In the scientific and technical use of magnetic fields, there were numerous breakthroughs in recent decades, finding wide range of applications from data storage, information processing, to position detectors in smartphones. Today's industry standard in the applied magnetometry is defined by Hall sensors, which are widely used in Smartphones, position detectors or belt buckles. They operate as electrical switches easily interfaced with a variety of devices, less expensive, measure a wide range of magnetic fields, but provide very low accuracy and sensitivity. Quantum magnetometers powered by Nitrogen Vacancy centers (NV) in diamond have shown promising applications in nanoscale applications due to their high spatial resolution, alongside their pico-tesla sensitivity and precision to a chemical shift. Their high band-width and dynamic range make them unique for industrial applications and fundamental science studies. With the possibility for miniaturization of these sensors to sizes below few millimetres they also find applications in car industry (automated driving) and in medical imaging (magneto-cardiography, encephalography).
The ability to sensitively detect individual charges under ambient conditions would benefit a wide range of applications across disciplines. However, most current techniques are limited to low-temperature methods such as single-electron transistors, single-electron electrostatic force microscopy and scanning tunnelling microscopy. By using quantum defects in diamond, sensitvites of µV/m can be achieved in electric field measurements. The sensors can be switched between electric- and magnetic-field sensing modes allowing them for nanoscale detection and ambient operation. Such hybrid sensors should open up new frontiers in imaging and sensing applications ranging from materials science to bioimaging.
Diamond scanning probe tips are new key components for nanoscale magnetometry. SQUTEC fabricates scanning probe tips in a variety of geometries with tip diameters form 150 to 400nm and single as well as multiple defect centers.